FISCHER INSTRUMENTATION(G.B.)LIMITED
About us
Allow us to introduce ourselves.
We are Fischer, and we make your world measurably easier. Both with a unique service and with our precise, intelligent, measuring solutions for coating thickness measurement, material analysis, and material testing.
As one of the leading manufacturers of measuring instruments since 1953, we help our customers to concentrate on what is important: Your work. We take care of the rest.
Products & services
New FISCHERSCOPE® XDAL® and XDV®
When precision pushes boundaries, our FISCHERSCOPE® XDAL® redefines what’s possible. The innovative successor to our FISCHERSCOPE® X-RAY XDAL® is ideal for applications in the field of thin and very thin coatings < 0.05 μm and for material analysis in the ppm range. You can choose between our models XDAL® 650, equipped with our powerful silicon drift detector 50 mm², and XDAL® 620, equipped with a silicon drift detector 20 mm². Together with our cutting-edge FISIQ® X XRF software, this high-end solution ensures a smooth measuring process for greater convenience, safety, and maximum throughput. Built for maximum speed, highest precision, and intuitive ease of use – that's how we introduce the new generation of XRF instruments with our FISCHERSCOPE® XDV®. As one of our high-end XRF solutions, the instrument is designed for measuring on microstructures with confidence. Combined with our cutting-edge FISIQ® X software, the device delivers outstanding measuring performance. In addition, simplified and efficient workflows ensure smooth measurement processes and significantly increased throughput in your quality control.
DMP®10-40 series
The handheld coating thickness measurement devices from the DMP10 to DMP40 range deliver precise results and the various measurement techniques available make them highly flexible. Models are available with magnetic inductive measurement (DELTASCOPE®), eddy current measurement (ISOSCOPE®) or both techniques combined (DUALSCOPE®). By attaching different probes to these instruments, you quickly create the right solution for virtually any measurement task.
FERITSCOPE® DMP®30
Unbeatable in tactile ferrite and martensite content measurement. Extensive functionalities packed in a robust and high-quality all-aluminum housing with a modern design and paired with our intuitive FISIQ® T software: The FERITSCOPE® DMP®30 is specially engineered for measuring ferrite and martensite content in chemical plants, energy plants or process plants, even in hard-to-reach places. Discover the next generation of tactile coating thickness measurement!
MP0® series
The MP0 and MP0R are simple, non-destructive coating thickness gauges. With their dual displays, robust housings and wear-resistant probe tips, they’re the ideal companions for reliable usage onsite. Whether on cars, ships, bridges or inaccessible steel structures, these small handheld paint thickness gauges, you can measure the vehicle paint thickness and anti-corrosion paint thickness quickly, easily and non-destructively.
X-RAY XAN® 500
Handheld, desktop, inline: the XAN®500 X-ray fluorescence instrument is Fischer’s most versatile yet. It can be used as a handheld device, as a fully enclosed desktop unit or integrated directly into production lines. Equipped with a tablet computer, the XAN500 also utilizes the time-proven WinFTM® software. Besides the classic coating thickness measurement functions, WinFTM also provides fundamental parameter analysis. This makes it possible to measure without prior calibration – that is, standard-free.
XDV®
The models of the XDV® series are the most powerful X-ray fluorescence instruments in the Fischer portfolio. They are equipped with a highly sensitive silicon drift detector (SDD) and can further be fitted with different apertures and filters. Additionally, XDV-µ instruments come with a micro-focus tube. This makes them ideal for very demanding measurement tasks. Using XDV devices you can, for instance, analyze the thickness and elemental composition of coatings just 5 nm thick and test structures of just 10 µm.
X-RAY XDL®
With motor-driven axes (optional) and measurement direction from top to bottom, the measurement instruments from the XDL® range enable automated serial tests. A variety of versions – differing in their X-ray source, filter, Aperture and detector – make it possible to select the X-ray device with the configuration that best suits your specific measurement task.
X-RAY XULM®/XUL®
Measurement instruments from the XUL® series are the solution of choice wherever the need is to determine coating thicknesses quickly and very precisely in electroplating or electronics manufacturing. The X-ray fluorescence instruments measure from bottom to top, enabling easy positioning of samples on the measuring stage. All X-ray instruments in this range are equipped with the same detector. You can choose apertures, filters and X-ray tubes according to the individual measurement task.
X-RAY XAN®
The main application of the instruments from the XAN® range is coating thickness measurement and analysis of gold and other precious-metal alloys. Products in this range stand out through their ease of use and advantageous price-performance ratio. In addition, detectors, apertures and filters can be adapted according to requirements, so that the optimal measurement instrument is available for every material composition.
COULOSCOPE® CMS2 and CMS2 STEP
Instruments from the COULOSCOPE CMS2 range measure coating thicknesses by means of deplating layers through electrolysis. In particular, the Coulometric method can be used to precisely determine multi-layers on any kind of substrate. The CSM2 STEP version is deployed for standards-compliant STEP Test measurement of single layers and to detect differences in potential, for example in the quality control of nickel multi-layers.
X-RAY 4000 Series
The FISCHERSCOPE X-RAY 4000 is specially designed for coating thickness measurement and material analysis during strip electroplating processes. This measurement system has already been installed over 300 times in electroplating plants of diverse sizes. Because of the fast mechanisms for moving the measurement head, readings can be taken at various points on the product to be measured. The instrument's modular design enables targeted selection of the optimal X-ray source and the ideal detector to meet your specific requirements.
