New FISCHERSCOPE® XDAL® and XDV®

When precision pushes boundaries, our FISCHERSCOPE® XDAL® redefines what’s possible. The innovative successor to our FISCHERSCOPE® X-RAY XDAL® is ideal for applications in the field of thin and very thin coatings < 0.05 μm and for material analysis in the ppm range. You can choose between our models XDAL® 650, equipped with our powerful silicon drift detector 50 mm², and XDAL® 620, equipped with a silicon drift detector 20 mm². Together with our cutting-edge FISIQ® X XRF software, this high-end solution ensures a smooth measuring process for greater convenience, safety, and maximum throughput.

Built for maximum speed, highest precision, and intuitive ease of use – that's how we introduce the new generation of XRF instruments with our FISCHERSCOPE® XDV®. As one of our high-end XRF solutions, the instrument is designed for measuring on microstructures with confidence. Combined with our cutting-edge FISIQ® X software, the device delivers outstanding measuring performance. In addition, simplified and efficient workflows ensure smooth measurement processes and significantly increased throughput in your quality control.