XDV®

The models of the XDV® series are the most powerful X-ray fluorescence instruments in the Fischer portfolio. They are equipped with a highly sensitive silicon drift detector (SDD) and can further be fitted with different apertures and filters. Additionally, XDV-µ instruments come with a micro-focus tube. This makes them ideal for very demanding measurement tasks. Using XDV devices you can, for instance, analyze the thickness and elemental composition of coatings just 5 nm thick and test structures of just 10 µm.